nanoREV QTF-AFM (more details here) has a surface probing cantilever which is made of quartz-tuning fork with etched tungsten tips attached to it. It made on the lines of the qPlus sensors invented by Dr. Franz J. Giessibl.

Product Info

Key Features :

  • Enables simultaneous acquisition of in-phase, quadrature-phase, and topography images for comprehensive surface characterization.

  • Capable of scanning a wide variety of samplesinsulating, conducting,  biological etc

  • Supports scan ranges greater than 90 µm × 90 µm, allowing both nanoscale detail and wide-area mapping

  • Performs frequency–distance (Δf–z) spectroscopy, providing precise tip–sample force interaction analysis

 

Specifications

Specifications:

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Documents

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